Résultats des tests de spécification
For Microelectronic Use |
30.0 - 32.0 % |
Assay (H₂O₂) |
30.0 - 32.0 % |
Color (APHA) |
≤10 |
Free Acid (µeq/g) |
≤0.2 |
Residue after Evaporation |
≤15 ppm |
Ammonium (NH₄) |
≤3 ppm |
Chloride (Cl) |
≤2 ppm |
Nitrate (NO₃) |
≤2 ppm |
Phosphate (PO₄) |
≤2 ppm |
ACS - Sulfate (SO₄) |
≤5 ppm |
Trace Impurities - Aluminum (Al) |
≤200.0 ppb |
Trace Impurities - Antimony (Sb) |
≤10.0 ppb |
Trace Impurities - Arsenic (As) |
≤10.0 ppb |
Arsenic and Antimony (as As) |
≤10.0 ppb |
Trace Impurities - Barium (Ba) |
≤20.0 ppb |
Trace Impurities - Beryllium (Be) |
≤10.0 ppb |
Trace Impurities - Bismuth (Bi) |
≤20.0 ppb |
Trace Impurities - Boron (B) |
≤10.0 ppb |
Trace Impurities - Cadmium (Cd) |
≤10.0 ppb |
Trace Impurities - Calcium (Ca) |
≤50.0 ppb |
Trace Impurities - Chromium (Cr) |
≤20.0 ppb |
Trace Impurities - Cobalt (Co) |
≤10.0 ppb |
Trace Impurities - Copper (Cu) |
≤10.0 ppb |
Trace Impurities - Gallium (Ga) |
≤20.0 ppb |
Trace Impurities - Germanium (Ge) |
≤10.0 ppb |
Trace Impurities - Gold (Au) |
≤10.0 ppb |
Heavy Metals (as Pb) |
≤500.0 ppb |
Trace Impurities - Iron (Fe) |
≤50.0 ppb |
Trace Impurities - Lead (Pb) |
≤10.0 ppb |
Trace Impurities - Lithium (Li) |
≤10.0 ppb |
Trace Impurities - Magnesium (Mg) |
≤10.0 ppb |
Trace Impurities - Manganese (Mn) |
≤10.0 ppb |
Trace Impurities - Molybdenum (Mo) |
≤10.0 ppb |
Trace Impurities - Nickel (Ni) |
≤10.0 ppb |
Trace Impurities - Niobium (Nb) |
≤10.0 ppb |
Trace Impurities - Potassium (K) |
≤600.0 ppb |
Trace Impurities - Silicon (Si) |
≤100.0 ppb |
Trace Impurities - Silver (Ag) |
≤10.0 ppb |
Trace Impurities - Sodium (Na) |
≤500.0 ppb |
Trace Impurities - Strontium (Sr) |
≤10.0 ppb |
Trace Impurities - Tantalum (Ta) |
≤10.0 ppb |
Trace Impurities - Thallium (Tl) |
≤50.0 ppb |
Trace Impurities - Tin (Sn) |
≤1000.0 ppb |
Trace Impurities - Titanium (Ti) |
≤10.0 ppb |
Trace Impurities - Vanadium (V) |
≤10.0 ppb |
Trace Impurities - Zinc (Zn) |
≤50 ppb |
Trace Impurities - Zirconium (Zr) |
≤10.0 ppb |