Résultats des tests de spécification
For Microelectronic Use |
69.0 - 70.0 % |
Assay (HNO₃) |
69.0 - 70.0 % |
Appearance |
Passes Test |
Color (APHA) |
≤10 |
Chloride (Cl) |
≤0.08 ppm |
Phosphate (PO₄) |
≤0.05 ppm |
Sulfate (SO₄) |
≤0.2 ppm |
Trace Impurities - Aluminum (Al) |
≤20 ppb |
Arsenic and Antimony (as As) |
≤3.0 ppb |
Trace Impurities - Barium (Ba) |
≤10.0 ppb |
Trace Impurities - Bismuth (Bi) |
≤50 ppb |
Trace Impurities - Boron (B) |
≤10.0 ppb |
Trace Impurities - Cadmium (Cd) |
≤5.0 ppb |
Trace Impurities - Calcium (Ca) |
≤50.0 ppb |
Trace Impurities - Chromium (Cr) |
≤30.0 ppb |
Trace Impurities - Cobalt (Co) |
≤5.0 ppb |
Trace Impurities - Copper (Cu) |
≤5.0 ppb |
Trace Impurities - Gallium (Ga) |
≤10.0 ppb |
Trace Impurities - Germanium (Ge) |
≤10.0 ppb |
Trace Impurities - Gold (Au) |
≤10.0 ppb |
Trace Impurities - Iron (Fe) |
≤50.0 ppb |
Trace Impurities - Lead (Pb) |
≤20.0 ppb |
Trace Impurities - Lithium (Li) |
≤10.0 ppb |
Trace Impurities - Magnesium (Mg) |
≤30.0 ppb |
Trace Impurities - Manganese (Mn) |
≤5.0 ppb |
Trace Impurities - Nickel (Ni) |
≤10.0 ppb |
Trace Impurities - Niobium (Nb) |
≤50.0 ppb |
Trace Impurities - Potassium (K) |
≤20.0 ppb |
Trace Impurities - Silicon (Si) |
≤60.0 ppb |
Trace Impurities - Silver (Ag) |
≤10.0 ppb |
Trace Impurities - Sodium (Na) |
≤60.0 ppb |
Trace Impurities - Strontium (Sr) |
≤10.0 ppb |
Trace Impurities - Tin (Sn) |
≤10.0 ppb |
Trace Impurities - Titanium (Ti) |
≤50.0 ppb |
Trace Impurities - Zinc (Zn) |
≤10.0 ppb |
Particle Count - 0.5 µm and greater |
≤90 par/ml |
Particle Count - 1.0 µm and greater |
≤10 par/ml |
Reported value is the average of all samples counted for this lot number,with no individual sample value exceeding the specification. |
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