Résultats des tests de spécification
For Microelectronic Use |
— |
Assay (C₅H₉NO) |
≥99.8 % |
Color (APHA) |
≤30 |
Water (H₂O)(by Karl Fischer titrn) |
≤300 ppm |
Free Amines (as CH₃NH₂) |
≤50 ppm |
Chloride (Cl) |
≤0.5 ppm |
Phosphate (PO₄) |
≤1 ppm |
Trace Impurities - Aluminum (Al) |
≤10.0 ppb |
Arsenic and Antimony (as As) |
≤10.0 ppb |
Trace Impurities - Barium (Ba) |
≤10.0 ppb |
Trace Impurities - Beryllium (Be) |
≤10.0 ppb |
Trace Impurities - Bismuth (Bi) |
≤10.0 ppb |
Trace Impurities - Boron (B) |
≤10.0 ppb |
Trace Impurities - Cadmium (Cd) |
≤10.0 ppb |
Trace Impurities - Calcium (Ca) |
≤10.0 ppb |
Trace Impurities - Chromium (Cr) |
≤10.0 ppb |
Trace Impurities - Cobalt (Co) |
≤10.0 ppb |
Trace Impurities - Copper (Cu) |
≤10.0 ppb |
Trace Impurities - Gallium (Ga) |
≤10.0 ppb |
Trace Impurities - Germanium (Ge) |
≤10.0 ppb |
Trace Impurities - Gold (Au) |
≤10.0 ppb |
Trace Impurities - Iron (Fe) |
≤10.0 ppb |
Trace Impurities - Lead (Pb) |
≤10.0 ppb |
Trace Impurities - Lithium (Li) |
≤10.0 ppb |
Trace Impurities - Magnesium (Mg) |
≤10.0 ppb |
Trace Impurities - Manganese (Mn) |
≤10.0 ppb |
Trace Impurities - Molybdenum (Mo) |
≤10.0 ppb |
Trace Impurities - Nickel (Ni) |
≤10.0 ppb |
Trace Impurities - Niobium (Nb) |
≤10.0 ppb |
Trace Impurities - Potassium (K) |
≤10.0 ppb |
Trace Impurities - Silver (Ag) |
≤10.0 ppb |
Trace Impurities - Sodium (Na) |
≤10.0 ppb |
Trace Impurities - Strontium (Sr) |
≤10.0 ppb |
Trace Impurities - Tantalum (Ta) |
≤10.0 ppb |
Trace Impurities - Thallium (Tl) |
≤10.0 ppb |
Trace Impurities - Tin (Sn) |
≤10.0 ppb |
Trace Impurities - Titanium (Ti) |
≤10.0 ppb |
Trace Impurities - Vanadium (V) |
≤10.0 ppb |
Trace Impurities - Zinc (Zn) |
≤10.0 ppb |
Trace Impurities - Zirconium (Zr) |
≤10.0 ppb |
Particle Count - 0.3 µm and greater (Rion KS42AF) |
— |
Particle Count - 0.5 µm and greater (Rion KS42AF) |
≤100 par/ml |
Particle Count - 1.0 µm and greater (Rion KS42AF) |
≤10 par/ml |